RT XFEL structure of Photosystem II 730 microseconds after the third illumination at 2.03 Angstrom resolution
Serial Crystallography (SX)  
Starting Model(s)
| Initial Refinement Model(s) | 
|---|
| Type | Source | Accession Code | Details | 
|---|
|
experimental model | PDB |  7RF1 |   | 
Crystallization
| Crystalization Experiments | 
|---|
| ID | Method | pH | Temperature | Details | 
|---|
| 1 | BATCH MODE | 6.5 | 298 | 0.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000 | 
| Crystal Properties | 
|---|
| Matthews coefficient | Solvent content | 
|---|
| 3.22 | 61.75 | 
Crystal Data
| Unit Cell | 
|---|
| Length ( Å ) | Angle ( ˚ ) | 
|---|
| a = 117.573 | α = 90 | 
| b = 222.915 | β = 90 | 
| c = 309.999 | γ = 90 | 
| Symmetry | 
|---|
| Space Group | P 21 21 21 | 
|---|
Diffraction
| Diffraction Experiment | 
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | 
|---|
| 1 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS |  | 2018-05-25 | M | SINGLE WAVELENGTH | 
| Radiation Source | 
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
|---|
| 1 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.304 | SLAC LCLS | MFX | 
Serial Crystallography
| Sample delivery method | 
|---|
| Diffraction ID | Description | Sample Delivery Method | 
|---|
| 1 | Drop-on-tape | injection | 
| Measurement | 
|---|
| Diffraction ID | Pulse Duration | Pulse Repetition Rate | Focal Spot Size | Pulse Energy | Photons Per Pulse | 
|---|
| 1 | 40 (fs) | 10 | 7 | 9500 (KeV) |  | 
| Injection | 
|---|
| Diffraction ID | Description | Flow Rate | Injector Diameter | Injection Power | Injector Nozzle | Filter Size | Carrier Solvent | 
|---|
| 1 | Acoustic Droplet Ejection | 4 (µl/min) | undefined (µm) | acoustic wave |  |  | aqueous buffer | 
Data Collection
| Overall | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | 
|---|
| 1 | 2.03 | 29.87 | 99.7 | 0.988 | 3.94 | 112.6 |  | 520277 |  |  | 36.65 | 
| Highest Resolution Shell | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | 
|---|
| 1 | 2.03 | 2.06 |  |  | 0.063 | 0.34 | 9.2 |  | 
Refinement
| Statistics | 
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | 
|---|
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 7RF1 | 2.03 | 29.87 | 1.33 | 515614 | 4581 | 99.01 | 0.1805 | 0.1802 | 0.18 | 0.2225 | 0.22 | 41.16 | 
| Temperature Factor Modeling | 
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | 
|---|
 |  |  |  |  |  | 
| RMS Deviations | 
|---|
| Key | Refinement Restraint Deviation | 
|---|
| f_dihedral_angle_d | 17.3684 | 
| f_angle_d | 1.1566 | 
| f_chiral_restr | 0.0528 | 
| f_bond_d | 0.0092 | 
| f_plane_restr | 0.008 | 
| Non-Hydrogen Atoms Used in Refinement | 
|---|
| Non-Hydrogen Atoms | Number | 
|---|
| Protein Atoms | 41600 | 
| Nucleic Acid Atoms |  | 
| Solvent Atoms | 1896 | 
| Heterogen Atoms | 8566 | 
Software
| Software | 
|---|
| Software Name | Purpose | 
|---|
| PHENIX | refinement | 
| PDB_EXTRACT | data extraction | 
| cctbx.xfel | data reduction | 
| cctbx.xfel.merge | data scaling | 
| PHASER | phasing |