ELECTRON MICROSCOPY
| Sample |
|---|
| BG505 SOSIP.664 IN COMPLEX WITH 17B, SCD4, AND 8ANC195 |
| Specimen Preparation | |
|---|---|
| Sample Aggregation State | PARTICLE |
| Staining Type | NEGATIVE |
| Staining Material | uranyl acetate |
| Staining Details | |
| 3D Reconstruction | |
|---|---|
| Reconstruction Method | SINGLE PARTICLE |
| Number of Particles | 7174 |
| Reported Resolution (Å) | 17 |
| Resolution Method | |
| Other Details | SUBMISSION BASED ON EXPERIMENTAL DATA FROM EMDB EMD-3086. (DEPOSITION ID: 13327). |
| Refinement Type | |
| Symmetry Type | POINT |
| Point Symmetry | C3 |
| Map-Model Fitting and Refinement | |||||
|---|---|---|---|---|---|
| Id | 1 | ||||
| Refinement Space | |||||
| Refinement Protocol | OTHER | ||||
| Refinement Target | |||||
| Overall B Value | |||||
| Fitting Procedure | |||||
| Details | METHOD--MANUAL DOCKING AND LOCAL CORRELATION | ||||
| Data Acquisition | |||||||||
|---|---|---|---|---|---|---|---|---|---|
| Detector Type | GATAN ULTRASCAN 1000 (2k x 2k) | ||||||||
| Electron Dose (electrons/Å**2) | |||||||||
| Imaging Experiment | 1 |
|---|---|
| Date of Experiment | 2015-04-07 |
| Temperature (Kelvin) | |
| Microscope Model | FEI TECNAI 12 |
| Minimum Defocus (nm) | |
| Maximum Defocus (nm) | |
| Minimum Tilt Angle (degrees) | |
| Maximum Tilt Angle (degrees) | |
| Nominal CS | 2.2 |
| Imaging Mode | BRIGHT FIELD |
| Specimen Holder Model | |
| Nominal Magnification | 42000 |
| Calibrated Magnification | |
| Source | LAB6 |
| Acceleration Voltage (kV) | 120 |
| Imaging Details |
| EM Software | ||
|---|---|---|
| Task | Software Package | Version |
| MODEL FITTING | UCSF Chimera | |
| RECONSTRUCTION | EMAN | 2 |
| RECONSTRUCTION | RELION | |
| Image Processing | ||||
|---|---|---|---|---|
| CTF Correction Type | CTF Correction Details | Number of Particles Selected | Particle Selection Details | |
| INDIVIDUAL PARTICLES | ||||
