X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | VAPOR DIFFUSION, SITTING DROP | 277 | 1.4M Ammonium Sulfate, 4% (w/v) glycerol, 0.1M HEPES pH 7.5 | |
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 3.26 | 62.23 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 79.031 | α = 90 | 
| b = 79.031 | β = 90 | 
| c = 204.206 | γ = 120 | 
| Symmetry | |
|---|---|
| Space Group | P 31 2 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 100 | PIXEL | DECTRIS PILATUS 6M | 2022-03-18 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | SLS BEAMLINE X10SA | 1.0000 | SLS | X10SA | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||
| 1 | 1.718 | 68.443 | 95.9 | 0.076 | 0.081 | 0.026 | 0.999 | 15.2 | 9.4 | 63052 | |||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | R Merge I (Observed) | Rrim I (All) | Rpim I (All) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||
| 1 | 1.718 | 1.871 | 69.1 | 1.399 | 1.481 | 0.483 | 0.621 | 9.3 | |||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | ||||
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | THROUGHOUT | 5nw1, 3mxf | 1.72 | 68.44 | 59918 | 3134 | 79.12 | 0.1692 | 0.1677 | 0.18 | 0.1973 | 0.2 | RANDOM | 37.641 | ||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| -0.04 | -0.02 | -0.04 | 0.12 | |||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| r_dihedral_angle_2_deg | 33.514 | 
| r_dihedral_angle_4_deg | 22.487 | 
| r_dihedral_angle_3_deg | 13.121 | 
| r_dihedral_angle_1_deg | 6.827 | 
| r_angle_refined_deg | 1.824 | 
| r_angle_other_deg | 1.463 | 
| r_chiral_restr | 0.086 | 
| r_bond_refined_d | 0.014 | 
| r_gen_planes_refined | 0.011 | 
| r_bond_other_d | 0.003 | 
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 3763 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 396 | 
| Heterogen Atoms | 115 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| XDS | data reduction | 
| Aimless | data scaling | 
| REFMAC | refinement | 
| PDB_EXTRACT | data extraction | 
| PHASER | phasing | 














