XFEL structure of cyanobacterial photosystem II (dark state, dataset1)
Serial Crystallography (SX)  
Starting Model(s)
| Initial Refinement Model(s) | 
|---|
| Type | Source | Accession Code | Details | 
|---|
|
experimental model | PDB |  4UB6 |   | 
Crystallization
| Crystalization Experiments | 
|---|
| ID | Method | pH | Temperature | Details | 
|---|
| 1 | BATCH MODE |  | 293 | PEG, magnesium sulfate | 
| Crystal Properties | 
|---|
| Matthews coefficient | Solvent content | 
|---|
| 3.35 | 63.32 | 
Crystal Data
| Unit Cell | 
|---|
| Length ( Å ) | Angle ( ˚ ) | 
|---|
| a = 121.97 | α = 90 | 
| b = 228.72 | β = 90 | 
| c = 286.98 | γ = 90 | 
| Symmetry | 
|---|
| Space Group | P 21 21 21 | 
|---|
Diffraction
| Diffraction Experiment | 
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | 
|---|
| 1 | 1 | x-ray | 100 | CCD | RAYONIX MX300-HS |  | 2016-11-01 | M | SINGLE WAVELENGTH | 
| Radiation Source | 
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
|---|
| 1 | FREE ELECTRON LASER | SACLA BEAMLINE BL3 | 1.2398 | SACLA | BL3 | 
Serial Crystallography
| Sample delivery method | 
|---|
| Diffraction ID | Description | Sample Delivery Method | 
|---|
| 1 |  | fixed target | 
Data Collection
| Overall | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | 
|---|
| 1 | 2.15 | 20 | 100 | 0.996 | 10.6 | 1341 |  | 431890 |  |  |  | 
| Highest Resolution Shell | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | 
|---|
| 1 | 2.15 | 2.23 |  |  | 0.287 |  |  |  | 
Refinement
| Statistics | 
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Starting model | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | 
|---|
| X-RAY DIFFRACTION | MOLECULAR REPLACEMENT | FREE R-VALUE | 4UB6 | 2.15 | 19.99 | 1.35 | 431890 | 21621 | 100 | 0.154 | 0.152 | 0.15 | 0.198 | 0.2 |  | 
| Temperature Factor Modeling | 
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | 
|---|
 |  |  |  |  |  | 
| RMS Deviations | 
|---|
| Key | Refinement Restraint Deviation | 
|---|
| f_dihedral_angle_d | 22.953 | 
| f_angle_d | 1.385 | 
| f_chiral_restr | 0.052 | 
| f_bond_d | 0.008 | 
| f_plane_restr | 0.006 | 
| Non-Hydrogen Atoms Used in Refinement | 
|---|
| Non-Hydrogen Atoms | Number | 
|---|
| Protein Atoms | 41513 | 
| Nucleic Acid Atoms |  | 
| Solvent Atoms | 2585 | 
| Heterogen Atoms | 9650 | 
Software
| Software | 
|---|
| Software Name | Purpose | 
|---|
| PHENIX | refinement | 
| CrystFEL | data reduction | 
| CrystFEL | data scaling | 
| PHASER | phasing |