X-RAY DIFFRACTION
Crystallization
| Crystalization Experiments | ||||
|---|---|---|---|---|
| ID | Method | pH | Temperature | Details | 
| 1 | EVAPORATION | 293 | 12% PEG4K, 15% glycerol, 100 mM Acetate de Sodium pH4, 200 mM Sodium isothiocyanate, 3% DMSO | |
| Crystal Properties | |
|---|---|
| Matthews coefficient | Solvent content | 
| 5.09 | 75.85 | 
Crystal Data
| Unit Cell | |
|---|---|
| Length ( Å ) | Angle ( ˚ ) | 
| a = 179.34 | α = 90 | 
| b = 132.5 | β = 101.21 | 
| c = 158.31 | γ = 90 | 
| Symmetry | |
|---|---|
| Space Group | C 1 2 1 | 
Diffraction
| Diffraction Experiment | ||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | |||||
| 1 | 1 | x-ray | 190 | PIXEL | DECTRIS PILATUS3 6M | 2015-02-16 | M | SINGLE WAVELENGTH | ||||||
| Radiation Source | |||||
|---|---|---|---|---|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
| 1 | SYNCHROTRON | SOLEIL BEAMLINE PROXIMA 1 | 0.9762 | SOLEIL | PROXIMA 1 | 
Data Collection
| Overall | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | |||||||||
| 1 | 2.85 | 48.97 | 99.5 | 6.6 | 3.1 | 84182 | 78.83 | ||||||||||||
| Highest Resolution Shell | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | ||||||||||||
| 1 | 2.85 | 3.01 | |||||||||||||||||
Refinement
| Statistics | |||||||||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | R-Free Selection Details | Mean Isotropic B | |||||
| X-RAY DIFFRACTION | THROUGHOUT | 2.85 | 48.97 | 83938 | 4195 | 99.27 | 0.2024 | 0.2014 | 0.22 | 0.2209 | 0.24 | RANDOM | 77.53 | ||||||
| Temperature Factor Modeling | ||||||
|---|---|---|---|---|---|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | |
| -1.8027 | 11.4742 | -5.539 | 7.3418 | |||
| RMS Deviations | |
|---|---|
| Key | Refinement Restraint Deviation | 
| t_other_torsion | 18.03 | 
| t_omega_torsion | 2.88 | 
| t_angle_deg | 1.09 | 
| t_bond_d | 0.01 | 
| t_dihedral_angle_d | |
| t_incorr_chiral_ct | |
| t_pseud_angle | |
| t_trig_c_planes | |
| t_gen_planes | |
| t_it | |
| Non-Hydrogen Atoms Used in Refinement | |
|---|---|
| Non-Hydrogen Atoms | Number | 
| Protein Atoms | 12660 | 
| Nucleic Acid Atoms | |
| Solvent Atoms | 36 | 
| Heterogen Atoms | 183 | 
Software
| Software | |
|---|---|
| Software Name | Purpose | 
| BUSTER | refinement | 
| XDS | data reduction | 
| Aimless | data scaling | 
| PHASER | phasing | 














