RT XFEL structure of Photosystem II 150 microseconds after the second illumination at 2.5 Angstrom resolution
Serial Crystallography (SX)  
Crystallization
| Crystalization Experiments | 
|---|
| ID | Method | pH | Temperature | Details | 
|---|
| 1 | BATCH MODE | 6.5 | 298 | 0.1 M MES pH 6.5, 0.1 M NH4Cl, 35% (w/v) PEG 5000 | 
| Crystal Properties | 
|---|
| Matthews coefficient | Solvent content | 
|---|
| 3.44 | 64.24 | 
Crystal Data
| Unit Cell | 
|---|
| Length ( Å ) | Angle ( ˚ ) | 
|---|
| a = 117.553 | α = 90 | 
| b = 222.695 | β = 90 | 
| c = 309.061 | γ = 90 | 
| Symmetry | 
|---|
| Space Group | P 21 21 21 | 
|---|
Diffraction
| Diffraction Experiment | 
|---|
| ID # | Crystal ID | Scattering Type | Data Collection Temperature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol | 
|---|
| 1 | 1 | x-ray | 298 | CCD | RAYONIX MX170-HS | Compound refractive lenses | 2017-07-13 | M | SINGLE WAVELENGTH | 
| Radiation Source | 
|---|
| ID # | Source | Type | Wavelength List | Synchrotron Site | Beamline | 
|---|
| 1 | FREE ELECTRON LASER | SLAC LCLS BEAMLINE MFX | 1.305 | SLAC LCLS | MFX | 
Serial Crystallography
| Sample delivery method | 
|---|
| Diffraction ID | Description | Sample Delivery Method | 
|---|
| 1 |  | fixed target | 
| Measurement | 
|---|
| Diffraction ID | Pulse Duration | Pulse Repetition Rate | Focal Spot Size | Pulse Energy | Photons Per Pulse | 
|---|
| 1 | 40 (fs) | 10 | 3 | 9.53 (KeV) |  | 
| Data Reduction | 
|---|
| Diffraction ID | Frames Indexed | Crystal Hits | Frames Indexed | Latices Merged | 
|---|
| 1 |  |  |  |  | 
Data Collection
| Overall | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (Observed) | CC (Half) | Net I Over Average Sigma (I) | Redundancy | Number Reflections (All) | Number Reflections (Observed) | Observed Criterion Sigma (F) | Observed Criterion Sigma (I) | B (Isotropic) From Wilson Plot | 
|---|
| 1 | 2.5 | 30.78 | 99.93 | 0.938 | 11.143 | 61.41 |  | 279073 |  |  |  | 
| Highest Resolution Shell | 
|---|
| ID # | Resolution (High) | Resolution (Low) | Percent Possible (All) | Percent Possible (Observed) | CC (Half) | Mean I Over Sigma (Observed) | Redundancy | Number Unique Reflections (All) | 
|---|
| 1 | 2.5 | 2.543 | 99.99 |  | 0.068 | 0.983 | 12.86 |  | 
Refinement
| Statistics | 
|---|
| Diffraction ID | Structure Solution Method | Cross Validation method | Resolution (High) | Resolution (Low) | Cut-off Sigma (F) | Number Reflections (Observed) | Number Reflections (R-Free) | Percent Reflections (Observed) | R-Factor (Observed) | R-Work (Depositor) | R-Work (DCC) | R-Free (Depositor) | R-Free (DCC) | Mean Isotropic B | 
|---|
| X-RAY DIFFRACTION |  | THROUGHOUT | 2.5 | 30.783 | 1.33 | 278571 | 2478 | 99.81 | 0.168 | 0.1673 | 0.17 | 0.2464 | 0.25 | 53.8673 | 
| Temperature Factor Modeling | 
|---|
| Anisotropic B[1][1] | Anisotropic B[1][2] | Anisotropic B[1][3] | Anisotropic B[2][2] | Anisotropic B[2][3] | Anisotropic B[3][3] | 
|---|
 |  |  |  |  |  | 
| Non-Hydrogen Atoms Used in Refinement | 
|---|
| Non-Hydrogen Atoms | Number | 
|---|
| Protein Atoms | 41576 | 
| Nucleic Acid Atoms |  | 
| Solvent Atoms | 1879 | 
| Heterogen Atoms | 19171 | 
Software
| Software | 
|---|
| Software Name | Purpose | 
|---|
| PHENIX | refinement | 
| PDB_EXTRACT | data extraction | 
| cctbx.xfel | data reduction | 
| PHASER | phasing |